| www.aarceeinternational.com Bookmarks | Multiple line width electromigration test structure and method |
| Apparatus and methods pertaining to examining electromigration lifespan are disclosed. In one aspect, a method of manufacturing is provided that includes forming a test structure on a semiconductor substrate. The test structure includes a first conductor Measuring device and measured quantity sensor having coupled processing and excitation frequenciesA measuring device for determining a measured quantity having an oscillatory str Statistical method and automated system for detection of particulate matter on wafer processing chucksA method of detecting the presence of particulate matter on a wafer chuck during Wireless connectorA connector includes circuitry for processing a signal and a transmitter for tra |
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